.jpg "QFN40(5x5)-0.4下壓老化座MCU測(cè)試燒錄用于JTAGSWSPI調(diào)試編程")
| 產(chǎn)品參數(shù) | |||
|---|---|---|---|
| 型號(hào) | QFN40(5x5)-0.4-0092TGH | ||
| 封裝/規(guī)格 | 插件 | ||
| 類型 | DIP | ||
| 間距 | 0.4 | ||
| 總針腳數(shù) | 40 1 | ||
| 圓孔/方孔 | 圓孔 | ||
| 觸頭鍍層 | 金 | ||
| 工作溫度范圍 | -45~155℃ | ||
| 包裝 | 盒裝 | ||
| 認(rèn)證機(jī)構(gòu) | CE | ||
| 最小包裝量 | 1 | ||
| 數(shù)量 | 1 | ||
| 封裝 | QFN | ||
| 批號(hào) | 以出貨為準(zhǔn) | ||
| 品牌 | ANDK | ||
QFN40(5x5)-0.4-0092TGH芯片測(cè)試座
1.引腳：40 signal Pin 1 GND；
2.間距：0.4mm
3.尺寸：5*5mm
4.Insulation Resistance:1000MΩ At 500V DC
5.Dielectic Withstanding Voltage:700V AC @ 1Min
6.Contact Resistance:≤50mΩ@10mA/20mV（initial）
7.Temperature:-45~155℃
8.Current Rating：1A Max.
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