5A26435H03plc
功能與參數(shù)測試
1.<測試儀>對器件的檢測,僅能反應出截止區(qū),放大區(qū)和飽和區(qū).但不
能測出工作頻率的高低和速度的快慢等具體數(shù)值等.
2.同理對TTL數(shù)字芯片而言,也只能知道有高低電平的輸出變化.而無
法查出它的上升與下降沿的速度.
四.晶體振蕩器
1.通常只能用示波器(晶振需加電)或頻率計測試,萬用表等無法測量,
否則只能采用代換法了.
2.晶振常見故障有:a.內(nèi)部漏電,b.內(nèi)部開路c.變質(zhì)頻偏d.外圍相連電
容漏電.這里漏電現(xiàn)象,用<測試儀>的VI曲線應能測出.
3.整板測試時可采用兩種判斷方法:a.測試時晶振附近既周圍的有關(guān)
芯片不通過.b.除晶振外沒找到其它故障點.
4.晶振常見有2種:a.兩腳.b.四腳,其中第2腳是加電源的,注意不可隨
意短路.
五.故障現(xiàn)象的分布
1.電路板故障部位的不完全統(tǒng)計:1)芯片損壞30%, 2)分立元件損壞30%,
3)連線(PCB板敷銅線)斷裂30%, 4)程序破壞或丟失10%(有上升趨勢).
2.由上可知,當待修電路板出現(xiàn)聯(lián)線和程序有問題時,又沒有好板子,既
不熟悉它的連線,找不到原程序.此板修好的可能性就不大了.
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Allen-Bradley(羅克韋爾),Schneider(施耐德),Siemens(西門子),GE(通用電氣),ABB,
Omron(歐姆龍),IFM(易福門),Emerson(艾默生),F(xiàn)anuc(發(fā)那科),F(xiàn)oxboro(福克斯波羅),
Westinghouse(西屋),Honeywell(霍尼韋爾),Panasonic(松下),Mitsubsihi(三菱),
Beckhoff(倍福),Yaskawa(安川),Pepperl+fuchs(倍加福),B&R(貝加萊),Danfoss(丹佛斯)
,F(xiàn)uji(富士),F(xiàn)esto(費斯托),Phoenix(菲尼克斯),Koyo(光洋),Yokogawa(橫河),
Heidenhain(海德漢),Hydac(賀德克),Hirschmann(赫斯曼),Keyence(基恩士),Moeller(穆勒),
Kuka(庫卡),Kollmorgen(科爾摩根),Lenze(倫茨),Rosemount(羅斯蒙特),LG,LS(產(chǎn)電),
Rexroth(力士樂),Leuze(勞易測),Norgren(諾冠),Pilz(皮爾茲),Pro-face(普洛菲斯),
SMC,Sanyo(三洋),Delta(臺達),Turck(圖爾克),Sick(施克),Sharp(夏普),Eaton(伊頓)
,bently (本特利)